Designed and executed functional and design validation flows for advanced RG NAND devices using silicon and simulation platforms
Developed deterministic usage‑case tests and random sequence generators to validate NAND commands and customer‑mode features
Performed electrical failure analysis of issues seen, root‑cause investigations (including digital and analog circuitry), and drove issue resolution with cross‑functional teams
Implemented automation frameworks using C‑based programming, Python, and Perl to improve test development and execution efficiency
Applied AI/ML‑assisted techniques (data analytics, pattern recognition, anomaly detection) to:
Accelerate failure triage and root‑cause analysis
Identify validation coverage gaps
Improve random sequence effectiveness and debug prioritization