Responsible for the performance, power consumption, and reliability testing and analysis of NAND memory products, and formulating test specifications and verification processes.
Develop and maintain test equipment (ATE), including the definition and implementation of test modes such as BIST, DFT, and DFM, continuously improving test coverage and optimizing test time.
Locate the causes of product failures after delivery and at the wafer stage through electrical failure analysis, design circuit analysis, physical failure analysis, and data analysis.
Collaborate with the product design team and process team to identify the root causes of failures and drive the implementation of solutions.
Support the testing and debugging of products in system‑level applications (such as SSD, UFS, eMCP) to ensure efficient use by customers and the system side.
Complete user manual verification, product test function verifi...